This new whitepaper explores how advanced cross-sectional analysis of battery electrodes - using scanning electron microscopy (SEM) and broad ion beam (BIB) milling - is enabling researchers and ...
Hosted on MSN
Why Cross Sectioning Matters in Battery Research
Electron microscopy is an essential technique for understanding battery materials; however, mere surface observation is insufficient for comprehensive analysis. The production of high-quality ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results